The spectrum is from a copper oxide film on a silicon substrate, and it shows the Cu 2p and O 1s regions. In this section, we will show you how to use Xps Peak Fit Software to analyze a sample XPS spectrum. It can help you perform peak fitting, background subtraction, peak identification, and quantification of XPS spectra with ease and accuracy. If you are looking for a free and powerful tool for XPS analysis, you should give Xps Peak Fit Software a try.
You can also download it from the US, UK or Hong Kong servers. It is a portable app that creates a sandbox folder in its current location, where it stores all its settings and temporary files. Xps Peak Fit Software is a free software that you can download from Software Informer, Free Download Manager, or Analyzetest. You can also customize the appearance of your plots by changing the colors, fonts, scales, labels, and legends. You can also print your spectra and reports directly from the software. Xps Peak Fit Software also allows you to export your results in various formats, such as ASCII, JPEG, PNG, BMP, and PDF. You can also calculate the atomic concentration and thickness of the surface layers using the sensitivity factors and attenuation lengths. You can use this database to identify the peaks in your spectrum and assign them to specific chemical states. Xps Peak Fit Software also provides a database of reference spectra and binding energies for various elements and compounds. You can also subtract the background using different methods, such as linear, polynomial, Tougaard, and Shirley. You can also adjust the peak parameters manually or automatically, and apply constraints and restraints to improve the fit quality. You can then perform peak fitting using various models, such as Gaussian, Lorentzian, Voigt, Doniach-Sunjic, and Shirley. Xps Peak Fit Software allows you to import XPS data from various formats, such as ASCII, VAMAS, CasaXPS, and XPSPEAK. It can run on Windows XP/Vista/7/8/10/11, 32-bit systems. This software is fully featured, easy to use, and portable. One of them is Xps Peak Fit Software, developed by Raymund Kwok. However, XPS data analysis can be challenging, especially when dealing with complex spectra with overlapping peaks, background signals, and noise.įortunately, there are some free software tools available that can help you perform peak fitting, background subtraction, peak identification, and quantification of XPS spectra. It can provide information on the elemental composition, chemical state, and bonding environment of the atoms on the surface. X-ray photoelectron spectroscopy (XPS) is a widely used technique for surface characterization of materials. Xps Peak Fit Software: A Free and Powerful Tool for XPS Analysis
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